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GROUPE DE RECHERCHE : WIND
GROUPE DE RECHERCHE : WIND
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Facilities

Drain current transient spectroscopy set-up

  • Acquisition card with dynamic memory management for uninterrupted large range monitoring duration.
  • Capability of initiating trapping/recovery monitoring within 100 nanoseconds, enabled by a high sampling rate of up to 10 MS/s (mega samples per second).
  • High-resolution data acquisition up to 24 bits essential for accurately capturing small changes in current transients.
  • Broad temperature variation range.

Partially funded by the European Commission within the call of European Defence Funds 2021

High voltage on-wafer power test bench up to 10 kV

  • On-wafer IV and CV room temperature measurements up to 10 kV under Fluorinert liquid and high current up to 20A
  • Enable quick assessment (NO packaging needed) directly on-wafer of lateraland vertical breakdown voltage as well as buffer trapping (substrate ramps)

Partially funded by the H2020 EU NMBP project InRelNPowerand the French national network LABEX GANEXT

Shared foundry processing of RF device

1)


2)

1) Common mask set for fabrication of discrete devices and pre-matched MMICs on4-inch substrat

2) Front-side active devices performed at IEMN while passives and back-end processing at the foundry for innovative technology assessment on industry representative devices

High power on-wafer power test bench at 40 GHz and 94 GHz

Active on-wafer Loadpull high power test bench at 40 GHz and 94 GHz

Both CW and pulsed mode (1μs pulsed width) available

Flexible impedance matching and high input power for optimum performance assessment

Partially funded by the EDA EU project EUGANIC and the French national network LABEX GANEXT

Wide bandgap device TCAD simulation

TCAD simulation provides many benefits such as reducing the time and manufacturing cycles spent to develop semiconductor technologies or increasing the understanding of mechanisms involved in innovative devices using emerging materials and heterostructures by visualizing internal physical processes.
We developed a methodology to simulate complex devices based on TCAD SILVACO simulation and modelling coupled with ADS software in order to reproduce and predict device behavior both in small and large signal regimes.

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      • Research
        • AlGaN/GaN HEMT thermal modeling and characterization
        • Measurement above 110GHz
        • Modelling of GaN-HEMT for high efficiency power converters
        • Nanoribbon-channel AlGaN/GaN HEMTs
        • New technological routes to improve thermal managements in GaN HEMTs
        • Power performance at 40GHz of AlGaN/GaN HEMTs on silicon substrate
        • Temperature monitoring of operating AlGaN/GaN HEMTs
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Cité Scientifique
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CS 60069
59 652 Villeneuve d'Ascq Cedex, France
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