Near Field Microscopy cluster (PCP)
The near-field cluster brings together resources dedicated to the topographic, physical and electrical analysis of surfaces from 100µm down to the atomic scale.
The emergence of this direct investigation technique at the nanoscale is at the origin of the emergence of nanoscience and nanotechnology. As soon as it was created in 1993, the IEMN decided to acquire this equipment to image, handle and characterize atoms and nanometric objects. Today, the cluster is installed on 400m² in a dedicated building, completed in 2015, offering exceptional experimental conditions..
Our instruments cover a wide spectrum of possibilities for the direct measurement of nanoscale phenomena: air AFM and derived modes, AFM/STM in Ultra-high vacuum, nano-manipulation, (multi-tip) transport measurements at the nanoscale, SEM/STM/AFM combination. The near-field microscopy cluster is dedicated to support IEMN research activities; it is also open to any external request for service or collaboration, academic or industrial, via the RENATECH network.
Contact : Maxime BERTHE, Head
firstname.lastname@example.org 03 20 19 78 63
Keywords: 3D microscopy, SPM, STM, AFM, Sub-nanometer resolution, Physical nanocharacterization, Renatech
Application areas: Nanoscience, Physics of surfaces, materials and nanostructures, Surface chemistry