MIR-THz microscopy and characterisation
The SNOM MIR-THz is a near-field optical measurement bench for acquiring images in the mid-infrared and terahertz ranges respectively, with a spatial resolution of the order of 30 nm (limited by the size of the AFM tip). Two laser sources are currently available for this purpose: a quantum cascade laser at 10µm and a THz molecular laser pumped by a CO2 laser.
This technique is well suited to the qualitative study of 2D materials such as graphene, molecular electronic nanostructures, doped materials (even if only slightly) and the study of waveguides induced by laser inscription in glass.
This equipment was acquired and developed as part of the Equipex Excelsior project.
Contact:
Tel : 03 20 19 79 11Tel : 03 20 19 79 30
Microwave microscopy (MMS)
Microwave scanning microscopy is a scanning probe technique. It is based on an AFM technique coupled to a VNA (Vector Network Analyzer).
The probe is specially designed for this type of measurement and is integrated into a special holder with RF connectors.
There are 2 types of MMS in the CHOP division:
- model 3600 LS Keysight, up to 12 GHz
- under vacuum, a home-made system integrated into a Tescan scanning electron microscope, up to 67 GHz
Applications
The technique is based on AFM but develops a specific electrical contact mode at microwave frequencies (2-67 GHz) that enables the surfaces of materials or devices to be mapped at the nanometric scale for microwave topography and reflectivity. The sample must be compatible with AFM topography measurements.
Example: SMM in the SEM illustration
Contact:
