The microwave optoelectronics characterisation bench consists mainly of a display system and positioners for dynamic electrical characterisation of (opto-) electronic components under constant or modulated power optical illumination. Using the instrumentation available on the platform, it is possible on this bench, for example, to :
- measure the electrical characteristics of components under continuous illumination in the form of a small signal (S parameter) up to 320 GHz
- measure component noise under continuous illumination up to 50 GHz
- frequency characterisation of the photoresponse of fast photodetectors. The optical wavelengths accessible are around 400 nm, 800 nm, 1000 nm, 1300 nm and 1550 nm.
A femto second laser with a high repetition rate can also be used to carry out measurements with a sampling rate of 1 GHz.
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