In Line Analysis Unit
Faisceau / beam
Whether they are used for non-destructive testing during manufacturing or for advanced process characterization, CMNF has a wide range of equipment for characterizing micro-nanostructures and components. Our numerous characterization tools can exploit optical, electrical and mechanical mechanisms for observations at different scales (nanometric to macroscopic, surface to bulk). These equipments allow to characterize the different technological operations such as deposition, etching, annealing, to measure thicknesses, to control the surface state, the morphology and the dimensions of the realized patterns.