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GROUPE DE RECHERCHE : CSAM
Slide thumbnailGROUPE DE RECHERCHE : CSAM
GROUPE DE RECHERCHE : CSAM
GROUPE DE RECHERCHE : CSAM
  • Introduction
  • Members
  • Micro-storage of energy
  • Energy-efficient circuits/systems
  • Multiscale radiofrequency characterization
  • Health care devices

CSAM Group: Multi-scale radio frequency characterisation

The axis multi-scale radiofrequency characterisation for systems and sensors now has a European dimension through European projects (ELENA, GRINSHIELD) and the EPM (European Partnership on Metrology), as well as an international dimension through ongoing collaborations with the UCI (University of California Irvine). The activities in this area concern microwave non-destructive testing. The methodologies and architectures implemented enable more accurate and reliable analyses of materials and structures. Significantly, these developments incorporate a multi-scale approach, enabling characterisation down to the nanometric scale, where variations in capacitance of a few atto-Farads can be measured.

In this way, this area is continuously contributing to the development of innovative and ground-breaking measurement equipment with internationally recognised expertise. These approaches are also driving the development of innovative microwave sensors incorporating a range of technologies from planar technologies and integrated circuits to waveguide technologies. Thanks to their versatility and portability, these sensors can be used in a wide range of applications (transport, agronomy, etc.).

Development of innovative, ground-breaking measurement equipment

The development of innovative and ground-breaking measurement equipment contributes to the advancement of research in the field of microwave non-destructive testing. By collaborating with regional, national and international partners, the group is creating cutting-edge instruments that push back current limits. These scientific advances have a direct impact on the quality of the measurements taken, enabling more accurate and reliable analyses of materials and structures. Significantly, these developments incorporate a multi-scale approach, enabling characterisation down to the nanometric scale. This ability to explore and measure on such a wide range of dimensional scales opens up new prospects for understanding and analysing physical phenomena and the properties of materials. In fact, by moving from macroscopic characterisation to investigations on the nanoscopic scale, the group is considerably broadening the spectrum of potential applications for its measurement equipment. This approach is one of the Group's strengths in the field of microwave non-destructive testing.

Very broadband nanoelectronic interface to the interior of living cells, integrating fluorescence readout of metabolic activity (Collab. UCI - P. Burke)

Design of microwave sensors adapted to non-laboratory conditions

The design of microwave sensors adapted to non-laboratory contingencies meets a growing need for portable and versatile measurement solutions. The sensors, developed by the CSAM Group in collaboration with industrial and academic partners, have applications in a wide range of fields, from the characterisation of materials or components to environmental or health monitoring. In scientific terms, these sensors make it possible to explore new areas of research and acquire data in real time in a variety of constrained environments. The sensors developed incorporate a range of technologies, from planar technologies and integrated circuits to waveguide technologies. Sensors are also shaped to meet a particular application. Specific calibration aspects and analytical and/or electromagnetic modelling are used to extract the quantities of interest from the measured data. The systems are automated to enable measurements to be made in real time. This automation is geared towards the reliability and reproducibility of measurements, with the aim of reducing operating costs and increasing the efficiency of data collection processes. The versatility and portability of these sensors make them attractive for a wide range of applications.

Sensors involving different technological approaches

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        • Marie LESECQ
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      • Research
        • AlGaN/GaN HEMT thermal modeling and characterization
        • Measurement above 110GHz
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