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Entries by editor

Seminar : Méthodologies nouvelles de microscopie à force atomique pour la biologie et les sciences des matériaux

Frédéric Eghiaian JPK Instruments AG 1 June 2018 at 10:30 am IEMN Salle du Conseil - Villeneuve d'Ascq Abstract: Initially developed for the physical sciences, atomic force microscopy (AFM) has grown to become an essential tool for characterising surfaces in many fields, ranging from the [...]

Seminar: Near field Microwave and Optical Microscopy

Davide Mencarelli, Ph.D. UPVM (Universita Polytechnica delle Marche) in Ancona (Italy) Friday 1st june 2018 - 2pm IEMN - LCI Salle du conseil - Villeneuve d'Ascq Abstract: Scanning Probe Microscopy (SPM) includes a wide class of different techniques united by the fact that a probe is scanned over a sample surface to build up [...]

Seminar: SCIENTEC, French distributor and manufacturer of scientific systems

Didier Pellerin, Director of SCIENTEC, and a representative of PREVAC 29 june 2018 - 10:30 IEMN - Villeneuve d'Ascq Abstract: SCIENTEC is a French distributor and manufacturer of scientific systems: Near Field, Scanning Electron Microscopy, Spectroscopy, Optical Profilometry, Mechanical Profilometry, Nano-Indentation, Thin Films, Vacuum Technology, Photometry - Colorimetry - Radiometry.

Seminar: SCANNING MICROWAVE MICROSCOPY

Davide Mencarelli, Ph.D. UPVM (Universita Polytechnica delle Marche) in Ancona (Italy) Friday 29 may 2018 - 2pm IEMN - LCI Salle du conseil - Villeneuve d'Ascq Abstract: Scanning Probe Microscopy (SPM) includes a wide class of different techniques united by the fact that a probe is scanned over a sample surface to build up [...]

Journée de la Recherche – découvrez le potentiel scientifique de la faculté des sciences et technologies de Lille

28 May 2018 at 09:00 LILLIAD Learning centre innovation - Villeneuve d'Ascq Abstract: With 9 teaching departments and 34 research structures, 27 of which have CNRS, INRIA, INRA and INSERM accreditation, the Faculty of Science and Technology is developing cutting-edge research of excellence. It is recognised at regional, national, international and [...]

Thèse : Échantillonnage de signaux radar par voie optoélectronique : étude des non-linéarités des photoconducteurs à cavité résonante

Yann DESMET Thesis defense 25 May 2018 at 14h00 IEMN Amphithéâtre - Villeneuve d'Ascq Abstract: We study here the nonlinear behaviour of a photoconductor used for microwave sampling. Optical absorption in these photoconductors is optimised by the use of a resonant cavity. We began by characterising photoconductors [...].

Seminar: OPTO-MECHANICS BY TRANSFORMATION OPTICS

Davide Mencarelli, Ph.D. UPVM (Universita Polytechnica delle Marche) in Ancona (Italy) Friday 25 May 2018 - 11pm IEMN - LCI Salle du conseil - Villeneuve d'Ascq Abstract: Rigorous approaches to the Electromagnetic/Mechanical problem are needed as a further step towards the development of microwave circuits based on phonon propagation at micro-and nano-scale. In the [...]

Atelier consacré à la préparation des substrats pour l’épitaxie

22-24 May 2018 IEMN - Villeneuve d'Ascq Abstract: Substrate preparation (cleaning, surface roughness, deoxidation, patterning, etc...) is an important step for the quality of epitaxial semiconductor layers. It has become crucial at a time when current research is focusing on subjects such as heteroepitaxy on silicon, lateral epitaxy [...].

Seminar: Industrial Robotics at Nanoscale

Professor Sergej Fatikow university of Oldenburg (AMIR group) 18 MAI 2018 at 11h00 IEMN amphithéâtre - Villeneuve d'Ascq Abstract : Current research activities in AMiR focus on the industrial microrobotics and nanoscale automation. The areas of research include nanohandling robots and systems; automated nanohandling methods; robot control methods for nanopositioning; fast vision feedback at nanoscale, [...]

Thesis: Study of non-stoichiometric III-V semiconductors for sampling microwave signals

Thomas Demonchaux Thesis defence 16 May 2018 at 10:30 am IEMN Amphithéâtre - Villeneuve d'Ascq Abstract: Discovered at the end of the 1980s, low-temperature epitaxial gallium arsenide (GaAs-BT) has interesting properties for optoelectronic applications. Its properties are intimately linked to the presence of point defects, the levels of which are [...]