31 January 2019 at IEMN
Campus Cité scientifique, Avenue Poincaré - Villeneuve d'Ascq
Come along with your samples!
This free workshop will focus on high-performance surface analysis methods.
Equipment presented :
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Table EM-30AX + COXEM SEM: Imaging + chemical analysis (EDS)
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AFM Nano-Observer CSI: Imaging + electrical measurements (ResiScope, HD-KFM) + mechanical characterisation (Soft IC)
Registration is free, but all participants are required to register due to limited space.
If you would like to bring your own samples for the practical sessions, please let us know so that we can make the necessary arrangements.
Presentations
- 09h00 - Welcome
- 09:30 - Presentation of the IEMN
- 09.45 - ScienTec presentation
- 10:00 - AFM CSI presentation
- 10:15 - Presentation MEB COXEM
- 10:30 - Coffee break
Demonstrations
- 10.45 - Demonstrations
- 12:30 - Lunch break
Handling
- 2.00 pm - Practical workshops and sample runs
- 3.30 pm - Coffee break
- 4.00 pm - Continuation of workshops
- 6.00 pm - Closing
Contact: Jessica Duval, Scientec
