Techniques de mesure de composants pour la 6G
In the run-up to the 6th generation of mobile telephony, scheduled for 2030. The band around 300 GHz has already been identified, and the first components and soon transmission systems will emerge, based on multiple technologies, which may be based on a combination of silicon and III-V technologies. One of the key points of these systems is the production of power components in the 300 GHz range in order to increase the range of these systems. To assess the performance of active circuits, it is essential to measure intermodulation in two-tone injection. The principle of this type of measurement is to inject two frequencies into the component to be measured at the same time. However, achieving bi-tone generation at 300 GHz is not easy. The technique developed here involves using an optoelectronic source capable of converting an optical signal at 1.55 µm (optical fibre wavelengths) into a 300 GHz signal.
This type of component also makes it easy to generate a series of frequencies at the same time when subjected to several input wavelengths. With this dual-frequency ("dual-tone") source in place, it has been shown for the first time [REF] that IP3 and IP5 (non-linearities of order 3 and 5) characterisation of active components becomes possible in the 300 GHz band using this technique. In addition, since the optoelectronic approach also enables the noise figure of the circuit to be measured, the noise/power measurement is obtained on a given device, in one go. The component tested is an active circuit using HEMT technology at 300 GHz, performing the LNA (low-noise amplifier) function.
H. Ghanem, S. Lépilliet, F. Danneville and G. Ducournau, « 300-GHz Intermodulation/Noise Characterization Enabled by a Single THz Photonics Source, » in IEEE Microwave and Wireless Components Letters, vol. 30, no. 10, pp. 1013-1016, Oct. 2020,