Near-field and high-frequency microscopy
The IEMN has acquired and developed several microscopes based on the detection of interaction between a fine probe and nanomaterials or (opto-)electronic components. Coupling these microscopes with high-frequency waves ranging from GHz to the visible range has made it possible to exalt certain physical and chemical properties that were previously inaccessible on the scale of a single object.
In the mid-1980s, the advent of the scanning tunnelling microscope and later near-field microscopy revolutionised our understanding of materials at the nanometre scale and ushered in the era of nanotechnology. These microscopes have become essential for probing the physical, chemical and biological properties of nanomaterials and extremely small electronic components.
As part of the "equipment of excellence" action of the French "Investissements d'Avenir" programme (EQUIPEX), the IEMN has received financial support of €3.2m for the Equipex Excelsior project, which is essential for making these microscopes multifunctional by coupling them with electromagnetic waves. Four instruments have been acquired and developed: 1) a high-frequency measurement and atomic force microscopy system integrated into a scanning electron microscope, 2) an ultrafast laser excitation system combined with a 4-point tunneling microscope operating in ultra-high vacuum and at variable temperature, 3) a low-temperature atomic force microscope with a magnetic field and 4) a near-field optical microscope operating from the mid-infrared to THz range. These four pieces of equipment have been grouped together in a building specially designed to meet the current instrumental challenges in the field of nanocaracterisation.
Due to its scale, this project has led to the publication of 130 scientific articles and the drafting of 4 patents, and will have had many positive spin-offs in terms of contracts obtained and partnerships forged with numerous European laboratories. Several technology transfers were made to French companies. These companies also benefited from unique know-how, hiring most of the young scientists who contributed to the project from among the thirty or so doctoral and post-doctoral students trained. At the end of this project, the rate of use by the scientific community outside the IEMN reached 55% and, thanks to the involvement of engineers dedicated to these microscopes, the instruments continue to be available, via the RENATECH network, to scientists from all horizons.