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First noise assessment of AIN/GaN HEMTs on silicon

Lien vers l’article : http://www.semiconductor-today.com/news_items/2011/AUG/IEMN_250811.html

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https://www.iemn.fr/wp-content/uploads/logos/logo_IEMN.png 0 0 editor https://www.iemn.fr/wp-content/uploads/logos/logo_IEMN.png editor2012-01-22 09:52:522012-05-22 09:53:00First noise assessment of AIN/GaN HEMTs on silicon
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