The platform and its equipments

Available techniques

  • STM  (Scanning Tunneling microscopy) : Atomic scale imaging and spectroscopy of the local density of electronic states;
  • AFM (Atomic Force Microscopy) : Nanoscale imaging in contact mode, non-contact and intermittent contact;
  • LFM (Lateral Force Microscopy) : Friction force microscopy in contact mode;
  • C-AFM (Conductive AFM) : Local conductivity measurement in contact mode;
  • PFM (Piezoresponse Force Microscopy) : Measurement of the piezoelectric response of a material in contact mode;
  • EFM/SP/KFM (Electric Force Microscopy/ Surface Potential /Kelvin Force Microscopy) : Charge detection, surface potential, piezo-electricity, charge/discharge kinetic observation, sensitivity of a few electrons;
  • MFM (Magnetic Force Microscopy) : Magnetic domains detection;
  • Local force spectroscopy, Nano-mechanics : Measurement of adhesive forces and elastic properties of materials;
  • CFM (Chemical Force Microscopy) : Chemical analysis of surfaces;
  • Nanolithography, nano-oxidation (oxide wires of 10 nm-width), in AFM and STM, ambiant air and Ultra-High Vacuum (UHV);
  • Nano-indentation,  Modification of materials;
  • Nano-manipulation : Displacement of atoms and nanostructures (nanowires).

5 microscopes in ambiant or controled atmosphere


5 microscopes en milieu ambiant ou contrôlé

3 microscopes under Ultra-High Vacuum

3 microscopes sous ultra-vide