Séminaire Ferry Kienberger
‘Scanning microwave microscopy: dopant profiling, spectroscopy, and modeling’ Ferry KIENBERGER Agilent Research Lab (Linz, Autriche) 24/10/2013 à 14h00 – Amphithéâtre de l’IEMN Scanning microwave microscopy (SMM) is a recent development in nanoscale imaging technique that combines the lateral resolution of atomic force microscopy (AFM) with the high measurement precision of microwave analysis at GHz frequencies. […]





