First noise assessment of AIN/GaN HEMTs on silicon 22 janvier 2012/dans Revue de presse /par AdministrateurLien vers l’article : http://www.semiconductor-today.com/news_items/2011/AUG/IEMN_250811.html https://www.iemn.fr/wp-content/uploads/2016/04/logo_IEMN.png 0 0 Administrateur https://www.iemn.fr/wp-content/uploads/2016/04/logo_IEMN.png Administrateur2012-01-22 09:52:522012-05-22 09:53:00First noise assessment of AIN/GaN HEMTs on silicon