Process monitoring, nano-characterization
Scanning probe microscopy, or SPM answers the growing demand of the research teams at IEMN for 3D imaging tools. This technique is complementary with other microscopy techniques in order to monitor processes at a smaller scale.
Most of all, this technique gives the opportunity to characterize a variety of physical behaviours (electrical, mechanical, chemical, magnetic…) of new materials and devices at the nanometric scale.
Physics of surfaces and nanostructures
This technique was introduced in our institute by the Physics Group and remains the main tool used for the investigation of surfaces and nanostructures in UHV.