{"id":76248,"date":"2025-12-09T15:17:02","date_gmt":"2025-12-09T13:17:02","guid":{"rendered":"https:\/\/www.iemn.fr\/?p=76248"},"modified":"2025-12-18T09:02:14","modified_gmt":"2025-12-18T07:02:14","slug":"probing-very-high-frequencies-at-the-very-heart-of-silicon","status":"publish","type":"post","link":"https:\/\/www.iemn.fr\/en\/newsletter\/probing-very-high-frequencies-at-the-very-heart-of-silicon.html","title":{"rendered":"Probing very high frequencies at the very heart of silicon"},"content":{"rendered":"<section  class='av_textblock_section av-miyfdk3p-4bf4352a16904ef7e17ef3089736ca3c'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><h2 style=\"line-height: 20pt; text-align: center;\"><strong><span style=\"color: #993366;\">Probing noise at very high frequencies at the very heart of silicon<\/span><\/strong><\/h2>\n<\/div><\/section>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miyb1s0u-89e201b2c2ee5ee30383333df4d29227\">\n#top .hr.av-miyb1s0u-89e201b2c2ee5ee30383333df4d29227{\nmargin-top:30px;\nmargin-bottom:30px;\n}\n.hr.av-miyb1s0u-89e201b2c2ee5ee30383333df4d29227 .hr-inner{\nwidth:500px;\nborder-color:#993366;\nmax-width:45%;\n}\n.hr.av-miyb1s0u-89e201b2c2ee5ee30383333df4d29227 .av-seperator-icon{\ncolor:#993366;\n}\n<\/style>\n<div  class='hr av-miyb1s0u-89e201b2c2ee5ee30383333df4d29227 hr-custom  avia-builder-el-1  el_after_av_textblock  el_before_av_textblock  hr-center hr-icon-yes'><span class='hr-inner inner-border-av-border-fat'><span class=\"hr-inner-style\"><\/span><\/span><span class='av-seperator-icon' aria-hidden='true' data-av_icon='\ue808' data-av_iconfont='entypo-fontello'><\/span><span class='hr-inner inner-border-av-border-fat'><span class=\"hr-inner-style\"><\/span><\/span><\/div>\n<section  class='av_textblock_section av-miy9ydyr-fdcd5db5808ef54022db4829eaba8c17'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><h5 style=\"text-align: justify; line-height: 20pt;\"><span style=\"color: #993366;\">Discover a new type of electronic measuring probe that directly integrates a miniaturized noise source as close as possible to the contact tips.<\/span> The objective is simple but the reality is complex: to characterize noise directly on silicon wafers, transistors, and BiCMOS circuits among the most frequency-performant, up to the G band of millimeter waves (140\u2013220 GHz). In the absence of suitable solutions on the market, <strong><span style=\"color: #993366;\">a customized amplified noise source was designed, with adjustable power, wide bandwidth, and built using the same technology as the components being measured. This original approach paves the way for more accurate, faster testing and active measurement probe technologies.<\/span><\/strong><\/h5>\n<\/div><\/section>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miygbs6i-7ce455c211c4a165c60492fd6d0899f5\">\n#top .hr.hr-invisible.av-miygbs6i-7ce455c211c4a165c60492fd6d0899f5{\nheight:50px;\n}\n<\/style>\n<div  class='hr av-miygbs6i-7ce455c211c4a165c60492fd6d0899f5 hr-invisible  avia-builder-el-3  el_after_av_textblock  el_before_av_one_fourth  av-small-hide av-mini-hide'><span class='hr-inner'><span class=\"hr-inner-style\"><\/span><\/span><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-rttl8m-af6bd69a7defbf4571a4f7b69e7676f4\">\n#top .flex_column.av-rttl8m-af6bd69a7defbf4571a4f7b69e7676f4{\nmargin-top:0px;\nmargin-bottom:0px;\n}\n.responsive #top #wrap_all .flex_column.av-rttl8m-af6bd69a7defbf4571a4f7b69e7676f4{\nmargin-top:0px;\nmargin-bottom:0px;\n}\n<\/style>\n<div  class='flex_column av-rttl8m-af6bd69a7defbf4571a4f7b69e7676f4 av_one_fourth  avia-builder-el-4  el_after_av_hr  el_before_av_three_fourth  first flex_column_div'     ><style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miy9zxps-6709e6766c71b5140b17ac573cbcac58\">\n#top .av_textblock_section.av-miy9zxps-6709e6766c71b5140b17ac573cbcac58 .avia_textblock{\ntext-align:justify;\n}\n<\/style>\n<section  class='av_textblock_section av-miy9zxps-6709e6766c71b5140b17ac573cbcac58'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><h5 class=\"p2\" style=\"text-align: justify; line-height: 20pt;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-44273723a8a15c0f8cd3a39ac3717da3\">\n.av_font_icon.av-mqde7m-1-5-44273723a8a15c0f8cd3a39ac3717da3{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-44273723a8a15c0f8cd3a39ac3717da3 .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-44273723a8a15c0f8cd3a39ac3717da3 avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>A smart measuring probe for very high frequencies: when the noise source enters the probe<\/span><\/strong><\/h5>\n<p class=\"p2\">As communication, radar, and imaging systems move toward the upper end of the millimeter wave spectrum, microelectronic technologies must push their own limits. Designing a circuit capable of operating at 170, 200, or 220 GHz is one thing. Being able to measure it reliably is another, equally critical challenge. Without accurate characterization, there can be no simulation models and no robust applications. It is precisely this technological barrier that this project(1) conducted at the ST-IEMN(2) joint laboratory is tackling: integrating a noise source directly into the measurement probe, as close as possible to the contact tips with the silicon.<\/p>\n<\/div><\/section><\/div>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-29p0jpp-e8036da66b98e9094a4598a729b0297a\">\n@keyframes av_boxShadowEffect_av-29p0jpp-e8036da66b98e9094a4598a729b0297a-column {\n0%   { box-shadow:  0 0 0 0 #c1bbbb; opacity: 1; }\n100% { box-shadow:  0 0 5px 0 #c1bbbb; opacity: 1; }\n}\n#top .flex_column.av-29p0jpp-e8036da66b98e9094a4598a729b0297a{\nmargin-top:0px;\nmargin-bottom:0px;\n}\n.flex_column.av-29p0jpp-e8036da66b98e9094a4598a729b0297a{\nbox-shadow: 0 0 5px 0 #c1bbbb;\nborder-width:10px;\nborder-color:#ffffff;\nborder-style:solid;\nborder-radius:10px 10px 10px 10px;\n}\n.responsive #top #wrap_all .flex_column.av-29p0jpp-e8036da66b98e9094a4598a729b0297a{\nmargin-top:0px;\nmargin-bottom:0px;\n}\n<\/style>\n<div  class='flex_column av-29p0jpp-e8036da66b98e9094a4598a729b0297a av_three_fourth  avia-builder-el-7  el_after_av_one_fourth  el_before_av_one_third  flex_column_div shadow-not-animated'     ><section  class='av_textblock_section av-miyfckvd-a27b1ba036306402859fa6245a1cb61c'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-76257 size-full\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3.jpg\" alt=\"\" width=\"1400\" height=\"650\" srcset=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3.jpg 1400w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3-300x139.jpg 300w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3-1030x478.jpg 1030w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3-768x357.jpg 768w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3-18x8.jpg 18w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2025\/12\/smart_probe_concept3-705x327.jpg 705w\" sizes=\"auto, (max-width: 1400px) 100vw, 1400px\" \/><\/a><br \/>\n<em>Active GSG measurement probe incorporating a G-band noise source (140-220 GHz) for wafer-level measurement<\/em><\/p>\n<\/div><\/section><\/div><\/p>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-1gwag19-759d212725b618d6c3b6010ed86bde50\">\n#top .flex_column.av-1gwag19-759d212725b618d6c3b6010ed86bde50{\nmargin-top:20px;\nmargin-bottom:20px;\n}\n.responsive #top #wrap_all .flex_column.av-1gwag19-759d212725b618d6c3b6010ed86bde50{\nmargin-top:20px;\nmargin-bottom:20px;\n}\n<\/style>\n<div  class='flex_column av-1gwag19-759d212725b618d6c3b6010ed86bde50 av_one_third  avia-builder-el-9  el_after_av_three_fourth  el_before_av_one_third  first flex_column_div  column-top-margin'     ><style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miyfjgfr-5c8e043c457bff848d8b13ed1d2549aa\">\n#top .av_textblock_section.av-miyfjgfr-5c8e043c457bff848d8b13ed1d2549aa .avia_textblock{\ntext-align:justify;\n}\n<\/style>\n<section  class='av_textblock_section av-miyfjgfr-5c8e043c457bff848d8b13ed1d2549aa'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><h5 class=\"p2\" style=\"text-align: justify; line-height: 20pt;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-1-c352c40c8fabf3a8d4435ce6157219c9\">\n.av_font_icon.av-mqde7m-1-5-1-c352c40c8fabf3a8d4435ce6157219c9{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-1-c352c40c8fabf3a8d4435ce6157219c9 .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-1-c352c40c8fabf3a8d4435ce6157219c9 avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>Why is noise a measurement tool?<\/span><\/strong><\/h5>\n<p class=\"p2\">In microwave electronics, noise is not just a nuisance: it is a reference signal. Engineers use it to determine key parameters such as the noise figure, which is used to evaluate signal degradation by a component (transistor, amplifier, mixer, etc.). At very high frequencies, these parameters directly determine the quality of an automotive radar, the range of a wireless link, or the sensitivity of an imaging sensor. However, in the G band (140\u2013220 GHz), there are virtually no suitable commercial noise sources on the market: they are expensive, difficult to control, rarely flat in frequency, and above all difficult to interface with test benches dedicated to wafer-level measurement. As a result, characterizing a latest-generation transistor can sometimes be more complicated than designing it.<\/p>\n<h5 class=\"p2\" style=\"text-align: justify; line-height: 20pt;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-7-d6e4373f1dd2b7fe11247d2e6238882c\">\n.av_font_icon.av-mqde7m-1-5-7-d6e4373f1dd2b7fe11247d2e6238882c{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-7-d6e4373f1dd2b7fe11247d2e6238882c .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-7-d6e4373f1dd2b7fe11247d2e6238882c avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>A decisive breakthrough: bringing the instrument closer to the device<\/span><\/strong><\/h5>\n<p class=\"p2\">Until now, two main approaches coexisted. The first consisted of integrating the test instrumentation directly into the chip to be measured (built-in self-test, or BIST). This was effective, but costly in terms of silicon surface area, and above all unusable for any technology other than the one in which it was manufactured. The second relied on external equipment connected by waveguides and transitions&#8230; all sources of loss, reflection, and uncertainty. <strong>The innovation introduced here is radical: placing the noise source in the measurement probe itself. Components are no longer tested \u201cremotely,\u201d but with an instrument almost attached to their terminal contacts. This approach introduces the concept of the smart probe, capable not only of contacting a circuit, but also of producing the noise spectrum necessary for its characterization.<\/strong><\/p>\n<\/div><\/section><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-1cpwcml-8f56d2847d0043180887d3c990841542\">\n#top .flex_column.av-1cpwcml-8f56d2847d0043180887d3c990841542{\nmargin-top:20px;\nmargin-bottom:20px;\n}\n.responsive #top #wrap_all .flex_column.av-1cpwcml-8f56d2847d0043180887d3c990841542{\nmargin-top:20px;\nmargin-bottom:20px;\n}\n<\/style>\n<div  class='flex_column av-1cpwcml-8f56d2847d0043180887d3c990841542 av_one_third  avia-builder-el-13  el_after_av_one_third  el_before_av_one_third  flex_column_div  column-top-margin'     ><style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miyflj7x-085f810362c99a98245ba83cab627ecc\">\n#top .av_textblock_section.av-miyflj7x-085f810362c99a98245ba83cab627ecc .avia_textblock{\ntext-align:justify;\n}\n<\/style>\n<section  class='av_textblock_section av-miyflj7x-085f810362c99a98245ba83cab627ecc'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><h5 class=\"p2\" style=\"text-align: justify; line-height: 20pt;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-6-89bb39b467cc1716954c3925ef3360be\">\n.av_font_icon.av-mqde7m-1-5-6-89bb39b467cc1716954c3925ef3360be{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-6-89bb39b467cc1716954c3925ef3360be .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-6-89bb39b467cc1716954c3925ef3360be avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>An innovative noise source&#8230; using the same technology as the tested circuits<\/span><\/strong><\/h5>\n<p class=\"p2\" style=\"text-align: justify;\"><strong>One of the project&rsquo;s innovative choices was to design this noise source using the same technology as the components to be measured<\/strong>: STMicroelectronics&rsquo; (ST) B55X BiCMOS technology, capable of reaching cutoff frequencies above 400 GHz. The results are convincing: in a packaged configuration, adjustable excess noise levels of up to 29 dB are obtained between 140 and 170 GHz, with impedance matching better than \u201312 dB across the entire band. <strong>In other words: the noise source is powerful, controllable, and well-matched, where the market is silent.<\/strong><\/p>\n<h5 class=\"p2\" style=\"text-align: justify;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-5-0188eb082acc66e2ae0e28f616dece1d\">\n.av_font_icon.av-mqde7m-1-5-5-0188eb082acc66e2ae0e28f616dece1d{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-5-0188eb082acc66e2ae0e28f616dece1d .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-5-0188eb082acc66e2ae0e28f616dece1d avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>The other key innovation: reinvented probe tips<\/span><\/strong><\/h5>\n<p class=\"p2\" style=\"text-align: justify;\">\u00a0High-precision measurement depends not only on electronics, but also on mechanics. At 200 GHz, a poorly aligned or overly fragile probe tip becomes a limiting factor. Hence the <strong>development of new Ground-Signal-Ground probes manufactured by femtosecond laser micro-machining.<\/strong> Made from a Schott AF32 glass substrate coated with nickel, these tips have remarkably low electrical contact resistance (0.05 ohms) and unmatched mechanical robustness: they can withstand forces more than three times greater than those required to ensure high-quality electrical contact. <strong>This advance is crucial for ensuring the reliability of thousands of successive contacts in industrial or laboratory environments.<\/strong><\/p>\n<\/div><\/section><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-skuo4t-985e777aefaa184f4bad3ccbf228a081\">\n#top .flex_column.av-skuo4t-985e777aefaa184f4bad3ccbf228a081{\nmargin-top:20px;\nmargin-bottom:20px;\n}\n.responsive #top #wrap_all .flex_column.av-skuo4t-985e777aefaa184f4bad3ccbf228a081{\nmargin-top:20px;\nmargin-bottom:20px;\n}\n<\/style>\n<div  class='flex_column av-skuo4t-985e777aefaa184f4bad3ccbf228a081 av_one_third  avia-builder-el-17  el_after_av_one_third  el_before_av_one_full  flex_column_div  column-top-margin'     ><style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miyfmrgf-a5fa473b2773666449562f93409b016e\">\n#top .av_textblock_section.av-miyfmrgf-a5fa473b2773666449562f93409b016e .avia_textblock{\ntext-align:justify;\n}\n<\/style>\n<section  class='av_textblock_section av-miyfmrgf-a5fa473b2773666449562f93409b016e'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><h5 class=\"p2\" style=\"text-align: justify; line-height: 20pt;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-4-27664731d89b9863d88cd07867120b22\">\n.av_font_icon.av-mqde7m-1-5-4-27664731d89b9863d88cd07867120b22{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-4-27664731d89b9863d88cd07867120b22 .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-4-27664731d89b9863d88cd07867120b22 avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>A glass interposer to reduce losses<\/span><\/strong><\/h5>\n<p class=\"p2\">\u00a0The final piece of the puzzle: the <strong>use of a glass interposer to integrate the \u2018noise source\u2019 chip as close as possible to the tips.<\/strong> Glass has low dielectric losses at very high frequencies, limiting signal attenuation and distortion. Thanks to laser micro-machining, interconnections are made with micrometric precision, simplifying the signal propagation path and drastically reducing parasitic transitions.<\/p>\n<h5 class=\"p2\" style=\"text-align: justify; line-height: 20pt;\"><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-3-ac2d0e5699925780d0b6965af1b53a42\">\n.av_font_icon.av-mqde7m-1-5-3-ac2d0e5699925780d0b6965af1b53a42{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-3-ac2d0e5699925780d0b6965af1b53a42 .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-3-ac2d0e5699925780d0b6965af1b53a42 avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue89a' data-av_iconfont='entypo-fontello' ><\/span><\/span>Benefits far beyond the laboratory<\/span><\/strong><\/h5>\n<h6 class=\"p2\" style=\"text-align: justify; line-height: 16pt;\"><strong><span style=\"color: #993366;\">This work goes far beyond the performance of an experimental setup. It offers a new instrumentation model for millimeter wave technologies: more compact, closer to the component, and more universal. For manufacturers, this means reduced testing costs, faster technological maturity, and greater reliability of end products. For researchers, it means access to measurements that were extremely difficult to perform until recently. By bringing the instrument closer to the silicon to the physical limit, this \u201csmart probe\u201d revolutionizes the way instruments are used.<\/span><\/strong><\/h6>\n<hr \/>\n<p class=\"p2\"><strong><strong><span style=\"color: #993366;\">\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-001b1026c1604aa480cb064bac0217db\">\n.av_font_icon.av-mqde7m-001b1026c1604aa480cb064bac0217db{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-001b1026c1604aa480cb064bac0217db .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-001b1026c1604aa480cb064bac0217db avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue805' data-av_iconfont='entypo-fontello' ><\/span><\/span><\/span><a href=\"mailto:Emmanuel.Dubois@iemn.fr\"><span style=\"color: #993366;\"><span style=\"color: #f16728;\"><span style=\"color: #993366;\">E<\/span><\/span><\/span><span style=\"color: #993366;\">mmanuel.Dubois@iemn.fr<\/span><\/a><\/strong><\/strong><\/p>\n<\/div><\/section><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-miyatqbt-c924266921325ed04581207d29041944\">\n#top .flex_column.av-miyatqbt-c924266921325ed04581207d29041944{\nmargin-top:0px;\nmargin-bottom:0px;\n}\n.flex_column.av-miyatqbt-c924266921325ed04581207d29041944{\nborder-width:25px;\nborder-color:#f4edef;\nborder-style:solid;\nborder-radius:10px 10px 10px 10px;\nbackground-color:#f4edef;\n}\n.responsive #top #wrap_all .flex_column.av-miyatqbt-c924266921325ed04581207d29041944{\nmargin-top:0px;\nmargin-bottom:0px;\n}\n<\/style>\n<div  class='flex_column av-miyatqbt-c924266921325ed04581207d29041944 av_one_full  avia-builder-el-22  el_after_av_one_third  avia-builder-el-last  first flex_column_div  column-top-margin'     ><section  class='av_textblock_section av-miyaslro-343c22e7066efc16235e21a03da1592a'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock'  itemprop=\"text\" ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-mqde7m-1-5-2-099c7fd01d9b3a5f7343b39590eb31e7\">\n.av_font_icon.av-mqde7m-1-5-2-099c7fd01d9b3a5f7343b39590eb31e7{\ncolor:#993366;\nborder-color:#993366;\n}\n.av_font_icon.av-mqde7m-1-5-2-099c7fd01d9b3a5f7343b39590eb31e7 .av-icon-char{\nfont-size:25px;\nline-height:25px;\n}\n<\/style>\n<span  class='av_font_icon av-mqde7m-1-5-2-099c7fd01d9b3a5f7343b39590eb31e7 avia_animate_when_visible av-icon-style- avia-icon-pos-left avia-icon-animate'><span class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello' ><\/span><\/span> <strong><span style=\"color: #993366;\">References<\/span><\/strong><\/p>\n<p class=\"p2\">(1) Maya Alawar, Sylvie Lepilliet, Victor Fiorese, Sylvie L\u00e9pilliet, Daniel Gloria, Guillaume Ducournau, Emmanuel Dubois, \u2018Toward smart probes for mmW on-wafer measurements: advanced packaging using laser micromachining of glass\u2019, IEEE Transactions on Microwave Theory and Techniques, vol. 73, no. 11, pp. 8544-8555, Nov. 2025, doi: 10.1109\/TMTT.2025.3595651<br \/>\n<a href=\"https:\/\/hal.science\/hal-05214588\" target=\"_blank\" rel=\"noopener\">https:\/\/hal.science\/hal-05214588\u00a0\u00a0\u00a0\u00a0<\/a> <a href=\"https:\/\/dx.doi.org\/10.1109\/TMTT.2025.3595651\" target=\"_blank\" rel=\"noopener\">https:\/\/dx.doi.org\/10.1109\/TMTT.2025.3595651<\/a><\/p>\n<p class=\"p3\"><span class=\"s3\">(2) ST-IEMN Joint Laboratory &#8211; <\/span><a href=\"https:\/\/www.cnrs.fr\/fr\/actualite\/laboratoire-commun-st-iemn-pascal-ancey-plus-de-vingt-ans-de-collaboration-dans-le\" target=\"_blank\" rel=\"noopener\">www.cnrs.fr\/fr\/actualite\/laboratoire-commun-st-iemn-pascal-ancey-plus-de- vingt-ans-de-collaboration-dans-le<\/a> Active GSG measurement probe incorporating a G-band noise source (140-220 GHz) for wafer-level measurement<\/p>\n<\/div><\/section><\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[297],"tags":[],"class_list":["post-76248","post","type-post","status-publish","format-standard","hentry","category-newsletter"],"_links":{"self":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/76248","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/comments?post=76248"}],"version-history":[{"count":9,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/76248\/revisions"}],"predecessor-version":[{"id":76628,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/76248\/revisions\/76628"}],"wp:attachment":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media?parent=76248"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/categories?post=76248"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/tags?post=76248"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}