{"id":31378,"date":"2019-01-29T11:57:46","date_gmt":"2019-01-29T09:57:46","guid":{"rendered":"https:\/\/www.iemn.fr\/?p=31378"},"modified":"2019-09-06T10:30:19","modified_gmt":"2019-09-06T08:30:19","slug":"excelsiors-annual-review-meeting","status":"publish","type":"post","link":"https:\/\/www.iemn.fr\/en\/actualites\/excelsiors-annual-review-meeting.html","title":{"rendered":"ExCELSIOR's Young researchers workshop"},"content":{"rendered":"<div  class='av-catalogue-container av-jrhlrl96-6455025429bb5846ec5c18ad3073e9e2'><ul class='av-catalogue-list'>\n<li><div class='av-catalogue-item av-av_catalogue_item-b77b41bea17221490cabeb980f84b8cb' ><div class=\"av-catalogue-item-inner\"><div class=\"av-catalogue-title-container\"><div class='av-catalogue-title'>09:00 - 10:00<\/div><div class='av-catalogue-price'><\/div><\/div><div class=\"av-catalogue-content\">\n<strong>Welcome<\/strong><br \/>\n<\/div><\/div><\/div><\/li>\n<li><div class='av-catalogue-item av-av_catalogue_item-de0a477bfd417b0c54549d804eec92d7' ><div class=\"av-catalogue-item-inner\"><div class=\"av-catalogue-title-container\"><div class='av-catalogue-title'>10:00 - 10:30<\/div><div class='av-catalogue-price'><\/div><\/div><div class=\"av-catalogue-content\">\n<span style=\"color: #993300;\"><strong>Romain PERRETI, IEMN<\/strong><\/span><\/p>\n<ul>\n<li>Near field optical microscopy for mid infrared to Thz'<\/li>\n<\/ul>\n<\/div><\/div><\/div><\/li>\n<li><div class='av-catalogue-item av-av_catalogue_item-c1a41bec77a41ee858af929bf40396b7' ><div class=\"av-catalogue-item-inner\"><div class=\"av-catalogue-title-container\"><div class='av-catalogue-title'>10:30 - 11:00<\/div><div class='av-catalogue-price'><\/div><\/div><div class=\"av-catalogue-content\">\n<strong>Louis BIADALA, Maxime BERTHE, IEMN<\/strong><\/p>\n<ul>\n<li>'Pulsed laser excitation with electrical detection by multiple-probe scanning tunneling microscopy'<\/li>\n<\/ul>\n<\/div><\/div><\/div><\/li>\n<li><div class='av-catalogue-item av-av_catalogue_item-356763d55e89edff2af84b1666a0925e' ><div class=\"av-catalogue-item-inner\"><div class=\"av-catalogue-title-container\"><div class='av-catalogue-title'>11:00 - 11:30<\/div><div class='av-catalogue-price'><\/div><\/div><div class=\"av-catalogue-content\">\n<strong>Natalia TUREK, IEMN<\/strong><\/p>\n<ul>\n<li>'High resolution imaging of molecular assemblies on Si(111): B by non-contact AFM at low temperature'<\/li>\n<\/ul>\n<\/div><\/div><\/div><\/li>\n<\/ul><\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":31524,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[8,204],"tags":[48,17,203],"class_list":["post-31378","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-actualites","category-maj-slider","tag-equipex","tag-excelsior","tag-workshop"],"_links":{"self":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/31378","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/comments?post=31378"}],"version-history":[{"count":0,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/31378\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media\/31524"}],"wp:attachment":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media?parent=31378"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/categories?post=31378"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/tags?post=31378"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}