{"id":17448,"date":"2018-05-25T17:47:06","date_gmt":"2018-05-25T15:47:06","guid":{"rendered":"https:\/\/www.iemn.fr?p=17448"},"modified":"2019-09-06T10:35:33","modified_gmt":"2019-09-06T08:35:33","slug":"seminar-microscopie-atomique","status":"publish","type":"post","link":"https:\/\/www.iemn.fr\/en\/actualites\/seminar-microscopie-atomique.html","title":{"rendered":"Seminar : M\u00e9thodologies nouvelles de microscopie \u00e0 force atomique pour la biologie et les sciences des mat\u00e9riaux"},"content":{"rendered":"<blockquote><p><strong><a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/eghiaian_frederic.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"size-thumbnail wp-image-17451 alignleft\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/eghiaian_frederic-80x80.jpg\" alt=\"\" width=\"80\" height=\"80\" srcset=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/eghiaian_frederic-80x80.jpg 80w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/eghiaian_frederic-36x36.jpg 36w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/eghiaian_frederic-180x180.jpg 180w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/eghiaian_frederic.jpg 200w\" sizes=\"auto, (max-width: 80px) 100vw, 80px\" \/><\/a>Fr\u00e9d\u00e9ric Eghiaian<br \/>\n<\/strong>soci\u00e9t\u00e9 <a href=\"https:\/\/www.jpk.com\/\">JPK Instruments AG<\/a><\/p>\n<p><strong>Le 1 juin 2018 \u00e0 10h30<br \/>\n<\/strong>IEMN Salle du Conseil \u2013 Villeneuve d\u2019Ascq<\/p><\/blockquote>\n<p><strong>\u00a0<\/strong><strong><a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/JPK_Instruments_AG_atomic_microscopy.png\"><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-17459 alignright\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/JPK_Instruments_AG_atomic_microscopy-390x321.png\" alt=\"\" width=\"220\" height=\"181\" \/><\/a>Abstract:<\/strong><\/p>\n<p>Initialement d\u00e9velopp\u00e9e pour les sciences physiques, la microscopie \u00e0 force atomique (AFM) a connu un essor faisant d\u2019elle un outil incontournable pour les caract\u00e9risations de surfaces dans de nombreux domaines allant des sciences des mat\u00e9riaux \u00e0 la biologie. Parall\u00e8lement \u00e0 l\u2019apparition r\u00e9cente de m\u00e9thodes \u2018multi-modales\u2019 pour la cartographie topographique, m\u00e9canique et \u00e9lectrique sur une gamme vari\u00e9e d\u2019\u00e9chantillons, l\u2019\u00e9mergence du champ de la m\u00e9cano-biologie a impos\u00e9 l\u2019AFM comme une m\u00e9thode majeure de caract\u00e9risation pour les sciences du vivant. Ces progr\u00e8s introduisent la n\u00e9cessit\u00e9 d\u2019un contr\u00f4le environnemental vari\u00e9, une vitesse d\u2019acquisition accrue et une plus grande simplicit\u00e9 d\u2019utilisation.<\/p>\n<p>JPK Instruments propose une solution polyvalente et simple d\u2019utilisation \u2013 le JPK NanoWizard \u2013 pour les caract\u00e9risations topographiques, \u00e9lectriques, et m\u00e9caniques sous contr\u00f4le environnemental, dans en milieu gazeux ou liquide. Je vous pr\u00e9senterai le principe de fonctionnement du NanoWizard et ses diff\u00e9rents couplages possibles avec des modules de contr\u00f4le environnemental (temp\u00e9rature de -120 \u00e0 300\u00b0C entre autres), microscopies optiques avanc\u00e9es (dont STED) et pinces optiques, avec leurs applications en imagerie multimodale \u2018QI-mode\u2019, entre autres. JPK Instruments propose \u00e9galement des solutions sp\u00e9cifiques aux mesures de faibles forces sur la mati\u00e8re molle, ces solutions pouvant \u00eatre coupl\u00e9es \u00e0 l\u2019AFM. Je vous pr\u00e9senterai enfin le mode de fonctionnement \u00e0 haute vitesse de balayage, permettant l\u2019obtention d\u2019images \u00e0 haute r\u00e9solution sur des dur\u00e9es de l\u2019ordre de 1-10s, ou sous la seconde avec le NanoWizard ULTRA Speed.<\/p>\n<p style=\"text-align: right;\"><a href=\"https:\/\/www.jpk.com\/\">https:\/\/www.jpk.com\/<\/a><br \/>\n<a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/logo_JPK_Instruments_AG.png\"><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-17455 size-full alignright\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2018\/05\/logo_JPK_Instruments_AG.png\" alt=\"\" width=\"174\" height=\"70\" \/><\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Fr\u00e9d\u00e9ric Eghiaian JPK Instruments AG 1 June 2018 at 10:30 am IEMN Salle du Conseil - Villeneuve d'Ascq Abstract: Initially developed for the physical sciences, atomic force microscopy (AFM) has grown to become an essential tool for characterising surfaces in many fields, ranging from the [...]<\/p>","protected":false},"author":2,"featured_media":17456,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[8],"tags":[128,129,127],"class_list":["post-17448","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-actualites","tag-atomique","tag-microscope","tag-microscopie"],"_links":{"self":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/17448","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/comments?post=17448"}],"version-history":[{"count":0,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/posts\/17448\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media\/17456"}],"wp:attachment":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media?parent=17448"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/categories?post=17448"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/tags?post=17448"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}