{"id":948,"date":"2012-05-18T18:45:02","date_gmt":"2012-05-18T16:45:02","guid":{"rendered":"https:\/\/www.iemn.fr\/?page_id=948"},"modified":"2012-05-18T18:45:02","modified_gmt":"2012-05-18T16:45:02","slug":"visit-the-platform-and-the-equipments","status":"publish","type":"page","link":"https:\/\/www.iemn.fr\/en\/scanning-probe-microscopy\/visit-the-platform-and-the-equipments","title":{"rendered":"Visit the platform and the equipments"},"content":{"rendered":"<div>\n<h1>The platform and its equipments<\/h1>\n<h2>Available techniques<\/h2>\n<ul>\n<li><strong>STM\u00a0 (Scanning Tunneling microscopy) <\/strong>: Atomic scale imaging and spectroscopy of the local density of electronic states;<\/li>\n<\/ul>\n<ul>\n<li><strong>AFM (Atomic Force Microscopy)<\/strong> : Nanoscale imaging in contact mode, non-contact and intermittent contact;<\/li>\n<\/ul>\n<ul>\n<li><strong>LFM (Lateral Force Microscopy) <\/strong>: Friction force microscopy in contact mode;<\/li>\n<\/ul>\n<ul>\n<li><strong>C-AFM (Conductive AFM) <\/strong>: Local conductivity measurement in contact mode;<\/li>\n<li><strong>PFM (Piezoresponse Force Microscopy)<\/strong> : Measurement of the piezoelectric response of a material in contact mode;<\/li>\n<\/ul>\n<ul>\n<li><strong>EFM\/SP\/KFM (Electric Force Microscopy\/ Surface Potential \/Kelvin Force Microscopy) <\/strong>: Charge detection, surface potential, piezo-electricity, charge\/discharge kinetic observation, sensitivity of a few electrons;<\/li>\n<\/ul>\n<ul>\n<li><strong>MFM (Magnetic Force Microscopy) <\/strong>: Magnetic domains detection;<\/li>\n<\/ul>\n<ul>\n<li><strong>Local force spectroscopy, Nano-mechanics <\/strong>: Measurement of adhesive forces and elastic properties of materials;<\/li>\n<\/ul>\n<ul>\n<li><strong>CFM (Chemical Force Microscopy) <\/strong>:<strong> <\/strong>Chemical analysis of surfaces;<\/li>\n<\/ul>\n<ul>\n<li><strong>Nanolithography,\u00a0nano-oxidation<\/strong> (oxide wires of 10 nm-width), in AFM and STM, ambiant air and Ultra-High Vacuum (UHV);<\/li>\n<\/ul>\n<ul>\n<li><strong>Nano-indentation, \u00a0Modification of materials<\/strong>;<\/li>\n<\/ul>\n<ul>\n<li><strong>Nano-manipulation <\/strong>:<strong> <\/strong>Displacement of atoms and nanostructures (nanowires).<\/li>\n<\/ul>\n<h2>5 microscopes in ambiant or controled atmosphere<\/h2>\n<\/div>\n<p>&nbsp;<\/p>\n<p><a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2012\/05\/AFM_fra.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter size-full wp-image-646\" title=\"5 microscopes en milieu ambiant ou contr\u00f4l\u00e9\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2012\/05\/AFM_fra.jpg\" alt=\"5 microscopes en milieu ambiant ou contr\u00f4l\u00e9\" width=\"600\" height=\"1014\" \/><\/a><\/p>\n<h2>3 microscopes under Ultra-High Vacuum<\/h2>\n<p><a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2012\/05\/STM_fra.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter size-full wp-image-647\" title=\"3 microscopes sous ultra-vide\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2012\/05\/STM_fra.jpg\" alt=\"3 microscopes sous ultra-vide\" width=\"600\" height=\"800\" \/><\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>The platform and its equipments Available techniques STM\u00a0 (Scanning Tunneling microscopy) : Atomic scale imaging and spectroscopy of the local density of electronic states; AFM (Atomic Force Microscopy) : Nanoscale imaging in contact mode, non-contact and intermittent contact; LFM (Lateral Force Microscopy) : Friction force microscopy in contact mode; C-AFM (Conductive AFM) : Local conductivity [&hellip;]<\/p>","protected":false},"author":2,"featured_media":0,"parent":930,"menu_order":4,"comment_status":"closed","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-948","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages\/948","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/comments?post=948"}],"version-history":[{"count":0,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages\/948\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages\/930"}],"wp:attachment":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media?parent=948"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}