{"id":49044,"date":"2021-12-16T16:28:36","date_gmt":"2021-12-16T14:28:36","guid":{"rendered":"https:\/\/www.iemn.fr\/?page_id=49044"},"modified":"2022-02-03T18:57:52","modified_gmt":"2022-02-03T16:57:52","slug":"marc-margalef-rovira","status":"publish","type":"page","link":"https:\/\/www.iemn.fr\/en\/marc-margalef-rovira","title":{"rendered":"Marc MARGALEV ROVIRA"},"content":{"rendered":"<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-av_heading-d4d3b99a19064f3ace5d67cd6344d3d7\">\n#top .av-special-heading.av-av_heading-d4d3b99a19064f3ace5d67cd6344d3d7{\npadding-bottom:10px;\n}\nbody .av-special-heading.av-av_heading-d4d3b99a19064f3ace5d67cd6344d3d7 .av-special-heading-tag .heading-char{\nfont-size:25px;\n}\n.av-special-heading.av-av_heading-d4d3b99a19064f3ace5d67cd6344d3d7 .av-subheading{\nfont-size:15px;\n}\n<\/style>\n<div  class='av-special-heading av-av_heading-d4d3b99a19064f3ace5d67cd6344d3d7 av-special-heading-h3  avia-builder-el-0  el_before_av_one_full  avia-builder-el-first'><h3 class='av-special-heading-tag'  itemprop=\"headline\"  >Marc Margalef Rovira<\/h3><div class=\"special-heading-border\"><div class=\"special-heading-inner-border\"><\/div><\/div><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-1ygmpg-5bc82f77ee78dd1b79117f2d52c5632b\">\n.flex_column.av-1ygmpg-5bc82f77ee78dd1b79117f2d52c5632b{\nborder-radius:0px 0px 0px 0px;\npadding:0px 0px 0px 0px;\n}\n<\/style>\n<div  class='flex_column av-1ygmpg-5bc82f77ee78dd1b79117f2d52c5632b av_one_full  avia-builder-el-1  el_after_av_heading  avia-builder-el-last  first flex_column_div av-zero-column-padding'     ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-kxyt53nw-30b5cbc9293aa7aed71084593f2c2690\">\n#top .hr.hr-invisible.av-kxyt53nw-30b5cbc9293aa7aed71084593f2c2690{\nheight:1px;\n}\n<\/style>\n<div  class='hr av-kxyt53nw-30b5cbc9293aa7aed71084593f2c2690 hr-invisible  avia-builder-el-2  el_before_av_textblock  avia-builder-el-first'><span class='hr-inner'><span class=\"hr-inner-style\"><\/span><\/span><\/div><br \/>\n<section  class='av_textblock_section av-kx925n7o-14fa5391af74b0297294cd9d4318197f'   itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock'  itemprop=\"text\" ><h3 style=\"text-align: center;\"><\/h3>\n<div id=\"attachment_49149\" style=\"width: 310px\" class=\"wp-caption alignleft\"><a href=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2022\/01\/Image-Margalef-Rovira4.png\"><img loading=\"lazy\" decoding=\"async\" aria-describedby=\"caption-attachment-49149\" class=\"wp-image-49149 size-medium\" src=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2022\/01\/Image-Margalef-Rovira4-300x248.png\" alt=\"\" width=\"300\" height=\"248\" srcset=\"https:\/\/www.iemn.fr\/wp-content\/uploads\/2022\/01\/Image-Margalef-Rovira4-300x248.png 300w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2022\/01\/Image-Margalef-Rovira4-15x12.png 15w, https:\/\/www.iemn.fr\/wp-content\/uploads\/2022\/01\/Image-Margalef-Rovira4.png 600w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/a><p id=\"caption-attachment-49149\" class=\"wp-caption-text\">A system to perform a load-pull analysis at 160 GHz and the associated power and phase detection<\/p><\/div>\n<h5 style=\"text-align: center;\">\"Development of an active load-pull characterization bench<br \/>\non ST B55 technology \"<\/h5>\n<p>The characterization of integrated devices in the millimeter frequency range (i.e., from 30 to 300 GHz) is one of the major challenges of the Si and SiGe technology today. This characterization is required to produce accurate models that can then be used for the design of circuits in this frequency domain. More accurately, in order to characterize the behavior under high power constraints of transistors and other active devices, measurements called load-pull must be conducted. In order to overcome the difficulties present in the millimeter frequency range to be able to carry out these measurements, measurement systems integrated in the chip and electrically connected to the Device Under Test are developed within the group.<\/p>\n<p>The figure here shows a system to perform a load-pull analysis at 160 GHz and the associated power and phase detection. This system has been fully designed on the 55 nm SiGe BiCMOS technology from STMicroelectronics. Thus, advanced calibration algorithms are studied in order to extract accurate measurements from the DST.<\/p>\n<\/div><\/section><\/p><\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-49044","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages\/49044","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/comments?post=49044"}],"version-history":[{"count":0,"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/pages\/49044\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.iemn.fr\/en\/wp-json\/wp\/v2\/media?parent=49044"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}