Our activities are focused on assessing the nanoscale properties of nanostructures, nanomaterials and/or nanodevices, with a special emphasis on their characterization using scanning probe techniques based on atomic force microscopy. Our experiments are mainly conducted and developed in the framework of the scanning-probe microscopy platform, where we develop experiments using atomic force microscopy in ambient air, ultrahigh vacuum and/or at low temperature, and electrical techniques derived from atomic force microscopy such as Kelvin probe force microscopy.
Illustration of on-going and recent activities
Imaging of molecules and molecular assemblies using stiff-probe (Kolibrisensor) AFM at low-temperature
(coll. FEMTO-ST)
Probing doped InAs NCs from Kelvin probe force microscopy (KPFM) experiments
with single charge sensitivity at 300K
(coll. U Jerusalem).
Modelling and characterization of lithographically-patterned metallicnanostructures
for high-performance tip-enhanced Raman spectroscopy
(coll.NAM6, HORIBA). D. Eschimèse et al., submitted to J. Phys. Chem C
KFM measurement and modeling of solar cell surface photovoltage transients
in the large signal domain
coll. NTU(Singapore), Journal of Physics D 51(34), 345501 (2018)
Tunneling mechanism and contact mechanics of colloidal nanoparticle assemblies
M Biaye et al. Nanotechnology 27 (47), 475502 (2016)
Charge Blinking Statistics of Semiconductor Nanocrystals Revealed
by Carbon Nanotube Single Charge Sensors
coll. Warsaw University of Technology, EZbydniewska, et al., Nano letters 15 (10), 6349-6356 (2015)
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