• Annuaire
  • Localisation
  • Publications
  • Intranet
  • Réservations
  • Français Français French fr
  • English English English en
IEMN
  • News
    • Last news
    • Positions
    • Press review
  • The Institute
    • Presentation
      • Brief historical
      • The institute today
    • Organization
      • Scientific Management
      • Administrative management
      • Technical department
  • Research
    • Research axis
      • Materials and nanostructures
      • Microtechnology & Microsystems
      • Micro/nano & opto-electronics
      • Communication systems & microwave applications
      • Acoustics
    • IEMN research groups
    • Evaluation folder
  • Facilities
    • Clean room
      • Facilities
      • Organization
      • Objectives
    • Characterization center
      • Assignment
      • Organization
      • Expertise
        • Low noise characterisation
        • Non linear characterization
        • Characterization over a wide temperature range
        • THz characterization
        • MEMs characterization
      • Visit characterization center
    • Scanning Probe Microscopy
      • Our goals
      • Organization
      • Discover the “nanoworld”
      • Visit the platform and the equipments
    • Telecom Platform
      • Its missions
      • Equipment
      • Organization
    • Technological plateform
      • Objectives
      • Organization
      • Projects
  • Collaborations
    • Academic collaborations
      • International collaborations
      • National collaborations
    • Partnership with Industry
      • Carnot Institute
      • IEMN-Transfert
      • IEMN-Industry joint laboratories
      • Start-up
  • Education
    • Master of Research degrees at the IEMN
      • Master research project titles
      • Master of Research
    • The PhD program
      • PhD projects
    • After the PhD
    • Diplomas 2015
    • Diplomas 2014
    • Diplomas 2013
  • Search
  • Menu
  • Objectives
  • Organization
  • Facilities
    • Caracterisations
      • Package
    • Litography
      • Electron beam lithography
      • Optical litography
    • Growth and deposition of thin layer
      • Atomic layer deposition
      • Gas-source molecular beam epitaxy
      • Hot process LP-CVD
      • Ionic implantation
      • Metalic deposition
      • Molecular beam epitaxy
      • Organic layer deposition, synthesis
      • PE-CVD cold process
      • Solid-source molecular beam epitaxy
    • Etching
      • Dry etching : Chemical
      • #896 (no title)
      • Dry Etching : Plasmas

Tags

BIOMEMS cancer CNRS conference Excelsior IEMN Japon LEAF rf-sensors Seminar SMMIL-E Séminaire
Followon TwitterSubscribeto RSS Feed

IEMN – Laboratoire Central de l’Institut

Cité Scientifique
Avenue Henri Poincaré
CS 60069
59 652 Villeneuve d'Ascq Cedex, France

+33 (0)3 20 19 79 79

Derniers articles

  • Les mardis de l’Innovation : L’enjeu global du stockage de l’énergie3 April 2018 - 9 h 00 min
  • IEMN : CS Industry Award30 March 2018 - 14 h 55 min
  • Séminaire : Innovative Colloidal Nanostructures: Nanoplatelets and III-V Quantum Dots5 April 2018 - 15 h 09 min
  • Séminaire : RF-Sensors in Advanced Applications12 April 2018 - 15 h 20 min
  • Séminaire : Molecular spin coupling at the tip of a STM26 March 2018 - 15 h 35 min

Horaires de l’accueil du Laboratoire Central

Lundi - Jeudi: 8:30 à 12:00 | 13:30 à 16:30
Vendredi: 8:30 à 12:00 | 13:30 à 16:00
Samedi - Dimanche: Fermé

Pôle SISR - powered by Enfold WordPress Theme
  • Plan du site
  • Localisation
  • Visite
  • Publications
  • Intranet
  • Contact
  • Mentions légales
  • Politique de confidentialité
Scroll to top