Welcome to the Nano-characterization and Scanning Probe Microscopy Platform!

Contact : Dominique Deresmes
Phone LCI/ISEN : +33 (0)3 20 19 78 63 / +33 (0)3 20 30 40 54
Phone LCI/ISEN : +33 (0)3 20 19 78 17 / +33 (0)3 20 30 40 60
Mail : dominique.deresmes(at)isen.iemn.univ-lille1.fr

The goal of the scanning probe microscopy platform is to image and characterize materials and nanostructures at the nanometer scale.

It is organized around two main techniques, AFM (Atomic Force Microscopy) and STM (Scanning Tunneling Microscopy), that are accessible through the corresponding responsible persons. You can take an appointment with them for the analysis of your samples or for a training.

For an overview of the possibilities and the equipment, please click on the folowing links: